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编码ABM8AIG-16.000MHZ-12-2-T3是一款3225mm四脚无源晶振专属于激光雷达，测量电路内SMD晶体的性能可以将未知转化为已知，从而消除这个问题。描述完整的频率选择网络，包括板寄生最小化不确定性和最大限度地提高长期系统可靠性的信心。

挑战在于大多数MCU数据表没有清楚地列出Cin和Cout的期望值;尽管它们在最终振荡频率中起着关键作用。限流电阻很少被使用，因为大多数MCU嵌入式振荡器回路不会对晶体产生过多的驱动。

easuring in-circuit crystal performance eliminates the problem by converting the unknowns into well knowns. Characterizing the complete frequencyselective network including board parasitics minimizes uncertainty and maximizes confidence in long term system reliability. These parameters include frequency accuracy of the oscillator loop, drive level seen by the crystal, and the closed-loop Gain Margin of the oscillator. The frequency at which the oscillator loop is oscillating should be as close as possible to the specified carrier frequency of the crystal. Deviating too far from the system’s boundary condition in frequency domain may result in system fault or failure. To achieve desired frequency accuracy, the crystal must see in-circuit capacitance equivalent to the plating capacitance set when the crystal was manufactured, such as 10pF, 12pF, 18pF, etc. The challenge lies in the fact that most MCU datasheets do not clearly outline the expected values for Cin and Cout; even though they play a critical role in the final oscillation frequency. The current limiting resistor is rarely engaged, since most MCU embedded oscillator loops do not present excessive drive to the crystal.